Montreal, Canada Office
Microbridge Technologies
Canada Inc.
1980 Sherbrooke St. West
Suite 505
Montreal, QC H3H 1E8 Canada
(514) 938-8089

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Quality and Reliability

Microbridge strives to achieve best-in-class quality and reliability in all Rejustor products by working with industry leaders in the manufacturing, assembly, testing and quality monitoring and verification industries. Every effort is made to ensure customers realize the benefits that the revolutionary Rejustor products can afford in their application. Quality is built-in at the design phase, tested through strict PCM monitoring at ISO-registered manufacturing facilities and validated at final test. Microbridge verifies Rejustor reliability through independent third-party testing at certified test houses.

Microbridge offers Rejustor products in diverse market areas and due to the unique characteristics of each application, product is subjected to custom qualification plans wherever possible. Consult Microbridge regarding specific qualification tests not listed below.

Test Test Conditions Result
Shock 500G, 1msec duration, XYZ axis 5 shocks each. Total 15 shocks per unit 0/22 parts failed.
Vibration Max acceleration 20G, 20~2000~20Hz, over 8 min, X,Y,Z axis each 4 sweeps. Total 12 sweeps per unit. 0/22 parts failed.
ESD Electrostatic Discharge (ESD) Sensitivity Testing Human Body Model (HBM). All pin combinations tested per JESD22-A114D Class 1A (250V)
Moisture Sensitivity Tested per J-STD-020C MSL1, 260°C convection reflow for SOIC-8 and QFN-16 packages
Preconditioning 150°C, 24 hrs. as per JESD22-A113E 0/77 parts failed drift specification of 0.6% at 1000 hrs.
High Temperature Storage 150°C, 1000h as per JESD22-A103C 0/77 parts failed drift specification of 0.6% at 1000 hrs.
Thermal Cycling -65°C to 125°C, 1000 cycles at 2 cycles per hour as per JESD22-A104B 0/77 parts failed drift specification of 0.6% at 1000 cycles
Rated Overload Testing Rated Voltage x2.5, 5sec.
MIL-R-55342H Par 4.8.6		 0/24 parts failed. All parts had no detectable drift
Operating Life 125°C, static bias as per JESD22-A108C 0/22 fail drift under full 1 mW operating bias after 1000 hours.
Humidity Testing 85°C, 85% Rh, 1000 hrs. as per JESD22-A101B 0/22 fail resistance drift specification of 1% after test.
Arrhenius Calculation for Ea and MTTF Accelerated aging at 125°C, 150°C, 175°C to characterize failure rate and predict MTTF. 0/169 parts failed after 4000 hours aging at 125°C, 150°C, 175°C and 200°C. Resistance changes observed correspond to intermatallic formation at Au-Al bondpads used in testing.